TXYZ, a program for semiconductor IC thermal analysis /

TXYZ, a program for semiconductor IC thermal analysis /

Bibliographic Details
Main Author: Albers, John
Corporate Author: United States. National Bureau of Standards
Format: Government Document Book
Language:English
Published: Washington, DC : U.S. Dept. of Commerce, National Bureau of Standards : 1984.
Series:Semiconductor measurement technology.
NBS special publication ; 400-76.
Subjects:
Semiconductors > Thermal properties.
Thermal analysis > Data processing.
Integrated circuits.

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Call Number: C 13.10:400-76
 
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