Polarization analysis and measurement : 19-21 July 1992, San Diego, California /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Goldstein, Dennis H., Chipman, Russell A.
Format: Book
Language:English
Published: Bellingham, Wash. : SPIE, [1992]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 1746.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/1746.toc

Similar Items