Probability of detection of defects in coatings with electronic shearography.

Bibliographic Details
Corporate Author: George C. Marshall Space Flight Center
Other Authors: Russell, S. S.
Format: Government Document Book
Language:English
Published: MSFC, Ala. : National Aeronautics and Space Administration, Marshall Space Flight Center ; [1995]
Series:NASA technical memorandum ; 108493.
Subjects:

Evans: US Documents Microfiche (3rd floor)

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Call Number: NAS 1.15:108493
 
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NAS 1.15:108493 Available