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960930s1996 wau b 001 0 eng |
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|a 96036820
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|a 0819423769 (alk. paper)
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|a (OCoLC)35688067
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|9 AHE3486AM
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|a DLC
|c DLC
|d TXA
|d UtOrBLW
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|a TXAM
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|a TA1555
|b .S43 1996
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082 |
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|a 621.36/75
|2 21
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245 |
0 |
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|a Selected papers on electronic speckle pattern interferometry :
|b principles and practice /
|c editors, Peter Meinlschmidt, Klaus D. Hinsch, Rajpal S. Sirohi.
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246 |
3 |
0 |
|a Electronic speckle pattern interferometry
|
264 |
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1 |
|a Bellingham, Wash :
|b SPIE Optical Engineering Press,
|c [1996]
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264 |
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4 |
|c ©1996
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300 |
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|a xix, 524 pages :
|b illustrations ;
|c 28 cm.
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336 |
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|a text
|b txt
|2 rdacontent
|
337 |
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|a unmediated
|b n
|2 rdamedia
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338 |
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|a volume
|b nc
|2 rdacarrier
|
490 |
1 |
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|a SPIE milestone series ;
|v v. MS 132
|
504 |
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|a Includes bibliographical references and index.
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650 |
|
0 |
|a Holographic interferometry.
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650 |
|
0 |
|a Speckle.
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650 |
|
0 |
|a Nondestructive testing.
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700 |
1 |
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|a Meinlschmidt, Peter,
|d 1960-
|
700 |
1 |
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|a Hinsch, K. D.
|q (Klaus D.),
|d 1941-
|
700 |
1 |
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|a Sirohi, R. S.
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830 |
|
0 |
|a SPIE milestone series ;
|v v. MS 132.
|
999 |
|
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|a MARS
|
999 |
f |
f |
|s 125d9372-a680-30a7-aaa3-28b4b66914cc
|i 65a3a9cd-abee-3aa7-953c-d99b00c1d895
|t 0
|
952 |
f |
f |
|p normal
|a Texas A&M University
|b College Station
|c Sterling C. Evans Library
|d Evans: Library Stacks
|t 0
|e TA1555 .S43 1996
|h Library of Congress classification
|i unmediated -- volume
|m A14820628061
|
998 |
f |
f |
|a TA1555 .S43 1996
|t 0
|l Evans: Library Stacks
|