Manufacturing yield evaluation of VLSI/WSI systems /

Bibliographic Details
Other Authors:	Ciciani, Bruno
Format:	Book
Language:	English
Published:	Los Alamitos, CA : IEEE Computer Society Press, [1995]
Subjects:	Integrated circuits > Very large scale integration > Design and construction > Data processing. Integrated circuits > Wafer-scale integration > Design and construction > Data processing. Integrated circuits > Very large scale integration > Reliability. Integrated circuits > Wafer-scale integration > Reliability. Fault-tolerant computing.