Scientific detection of fakery in art II : 20-21 September 1999, Boston, Massachusetts /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Chartier, Duane R., McCrone, Walter C., Weiss, Richard J. (Richard Jerome), 1923-
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [2000]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3851.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/3851.toc

Internet

https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/3851.toc

Remote Storage

Holdings details from Remote Storage
Call Number: N8558 .S35 2000
 
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N8558 .S35 2000 Available