Laser interferometry X : techniques and analysis : 31 July-1 August 2000, San Diego, [California] USA /
Corporate Author: | |
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Other Authors: | , , |
Format: | Book |
Language: | English |
Published: |
Bellingham, Washington :
SPIE,
[2000]
|
Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 4101. |
Subjects: |
Physical Description: | xv, 292 pages : illustrations ; 28 cm. |
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Bibliography: | Includes bibliographical references and index. |
ISBN: | 0819437468 |