Report on NIST-NACLA MOU Workshop on June 20, 2000 /

Bibliographic Details
Main Author: Leight, Walter G.
Corporate Authors: NIST-NACLA MOU Workshop, National Institute of Standards and Technology (U.S.)
Format: Government Document Conference Proceeding Microform Book
Language:English
Published: [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2000]
Series:NISTIR ; 6540.
Subjects:

MARC

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