Embedded digital system reliability and safety analyses /

Bibliographic Details
Main Author:	Kaufman, L. M.
Corporate Authors:	U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Engineering Technology, University of Virginia. Center for Safety-Critical Systems
Other Authors:	Johnson, B. W.
Format:	Government Document Microform Book
Language:	English
Published:	Washington, DC : Division of Engineering Technology, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission, 2001.
Series:	NUREG/GR ; 0020.
Subjects:	Digital control systems > Reliability. Nuclear power plants > Instruments > Reliability. Nuclear power plants > Instruments > Safety measures.