System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday /

Bibliographic Details
Other Authors: Hayakawa, Yu, Irony, Telba, Xie, M. (Min), Barlow, Richard E.
Format: Book
Language:English
Published: Singapore ; River Edge, NJ : World Scientific, [2001]
Series:Series on quality, reliability & engineering statistics ; v. 5.
Subjects:

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: TA169 .S97 2001
 
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TA169 .S97 2001 Available