Interferometry XI : techniques and analysis, 8-10 July 2002, Seattle, USA /

Interferometry XI : techniques and analysis, 8-10 July 2002, Seattle, USA /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Boeing Company
Other Authors: Creath, Katherine, Schmit, Joanna
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2002]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4777.
Subjects:
Interferometry > Congresses.
Interferometry > Methodology > Congresses.
Measurement > Congresses.
Metrology > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4777.toc
Description
Physical Description:xii, 426 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819445444