Interferometry XI : techniques and analysis, 8-10 July 2002, Seattle, USA /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Boeing Company
Other Authors:	Creath, Katherine, Schmit, Joanna
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2002]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4777.
Subjects:	Interferometry > Congresses. Interferometry > Methodology > Congresses. Measurement > Congresses. Metrology > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4777.toc