Interferometry XI : applications, 10-11 July 2002, Seattle, USA /

Interferometry XI : applications, 10-11 July 2002, Seattle, USA /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Boeing Company
Other Authors: Osten, Wolfgang
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2002]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4778.
Subjects:
Interferometry > Congresses.
Interferometry > Industrial applications > Congresses.
Measurement > Congresses.

Remote Storage

Holdings details from Remote Storage
Call Number: TA1555 .I59 2002
 
Call Number Status Get It
TA1555 .I59 2002 Available