Optical security and counterfeit deterrence techniques V : 20-22 January 2004, San Jose, California, USA /

Bibliographic Details
Corporate Authors: IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors: Van Renesse, Rudolf L.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2004]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5310.
Subjects:
Description
Physical Description:ix, 440 pages : illustrations (some color) ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819452130