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|a 2005295019
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|a 0871708043
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|a 9780871708045
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|a TXAM
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|a TK7871
|b .M52 2004
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| 245 |
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0 |
|a Microelectronics failure analysis :
|b desk reference /
|c edited by The Electronic Device Failure Analysis Society, Desk Reference Committee.
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| 250 |
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|a 5th ed.
|
| 264 |
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1 |
|a Materials Park, Ohio :
|b ASM International,
|c [2004]
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| 264 |
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4 |
|c ©2004
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| 300 |
|
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|a xiv, 800 pages :
|b illustrations ;
|c 28 cm. +
|e 1 CD-ROM (4 3/4 in.).
|
| 336 |
|
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|a text
|b txt
|2 rdacontent
|
| 337 |
|
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|a unmediated
|b n
|2 rdamedia
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| 338 |
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|a volume
|b nc
|2 rdacarrier
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| 500 |
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|a Includes bibliographical references and index.
|
| 505 |
0 |
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|a Introduction -- Failure analysis process flow -- Failure verification -- Failure mode: failure classifications -- Special devices -- Non-destructive analysis techniques -- Depackaging -- Photon emission (electroluminescence) localization techniques -- Microthermography -- Laser and particle beam-based localization techniques -- Deprocessing -- General imaging techniques -- Local deprocessing and imaging -- Materials analysis techniques -- Important topics for semiconductor devices -- FA techniques/tools roadmaps -- FA operation and management -- Appendix.
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| 538 |
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|a System requirements for accompanying CD-ROM: Windows 95/98/NT/ME/2000/XP ; Macintosh 8/9/Classic.
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| 650 |
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0 |
|a Electronics
|x Materials
|x Testing
|v Handbooks, manuals, etc.
|
| 650 |
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0 |
|a Microelectronics
|x Materials
|x Testing
|v Handbooks, manuals, etc.
|
| 650 |
|
0 |
|a Microelectronics
|x Materials
|x Defects
|v Handbooks, manuals, etc.
|
| 650 |
|
0 |
|a Electronic apparatus and appliances
|x Testing
|v Handbooks, manuals, etc.
|
| 650 |
|
0 |
|a Semiconductors
|x Defects
|v Handbooks, manuals, etc.
|
| 710 |
2 |
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|a Electronic Device Failure Analysis Society.
|b Desk Reference Committee.
|
| 945 |
|
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|a PromptCat
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|a qatar,ref
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|a Q14800037127
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|b Qatar Campus
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|b College Station
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