The physics of a single-event upset in integrated circuits : a review and critique of analytical models for charge collection /

The physics of a single-event upset in integrated circuits : a review and critique of analytical models for charge collection /

Bibliographic Details
Main Author: Roos, Oldwig von
Corporate Author: Jet Propulsion Laboratory (U.S.)
Other Authors: Zoutendyk, John
Format: Government Document Book
Language:English
Published: Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology, [1983]
Series:NASA contractor report ; NASA CR-173471.
Subjects:
Integrated circuits > Effect of radiation on.
Galileo Project.
Holes (electron deficiencies)
Jupiter (Planet)
Plasma physics.
Radiation belts.

Evans: US Documents Microfiche (3rd floor)

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Call Number: NAS 1.26:173471
 
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NAS 1.26:173471 Available