Manhattan picture worlds : Thomas Wrede /

Manhattan picture worlds : Thomas Wrede /

Bibliographic Details
Main Author: Wrede, Thomas, 1963-
Corporate Author: Beck & Eggeling
Other Authors: Schaden, Christoph, 1967-, Berman, Marshall, 1940-2013
Format: Book
Language:German
English
Published: Bielefeld : Kerber, 2009.
Series:Kerber photoart.
Subjects:
Wrede, Thomas, > 1963- > Exhibitions.
Description
Item Description:Published in conjunction with an exhibition at Beck & Eggeling, Dusseldorf, Germany, March 5-April 25, 2009.
Physical Description:117 pages : color illustrations ; 32 cm.
ISBN:9783866782440 (hd.bd.)
3866782446 (hd.bd.)