Manhattan picture worlds : Thomas Wrede /

Manhattan picture worlds : Thomas Wrede /

Bibliographic Details
Main Author: Wrede, Thomas, 1963-
Corporate Author: Beck & Eggeling
Other Authors: Schaden, Christoph, 1967-, Berman, Marshall, 1940-2013
Format: Book
Language:German
English
Published: Bielefeld : Kerber, 2009.
Series:Kerber photoart.
Subjects:
Wrede, Thomas, > 1963- > Exhibitions.

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