Condensed guide for the Stanford revision of the Binet-Simon intelligence tests.

"Presents a condensed guide for the application of the Binet-Simon Intelligence Scale-Stanford revision. This guide is intended for use by experienced examiners as a supplement to the books The Measurement of Intelligence, and The Intelligence of School Children. For the further aid of the exam...

Full description

Bibliographic Details

Main Author:	Terman, Lewis M. (Lewis Madison), 1877-1956
Format:	eBook
Language:	English
Published:	Boston, Mass. : Houghton Mifflin Company, 1930.
Series:	Riverside textbooks in education, ed. by E. P. Cubberley ... Division of secondary education, under the editorial direction of Alexander Inglis
Subjects:	Intelligence tests. Stanford-Binet Test. Binet-Simon Test. Intelligence Tests. Electronic books.
Online Access:	Connect to the full text of this electronic book