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|a Microelectronics failure analysis :
|b desk reference /
|c edited by Richard J. Ross ; EDFAS, ASM International.
|
| 246 |
3 |
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|a Microelectronics failure analysis desk reference
|
| 250 |
|
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|a 6th ed.
|
| 264 |
|
1 |
|a Materials Park, Ohio :
|b ASM International,
|c [2011]
|
| 264 |
|
4 |
|c ©2011
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| 300 |
|
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|a 1 online resource (xi, 660 pages) :
|b illustrations
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| 336 |
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|a text
|b txt
|2 rdacontent
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|a computer
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|a online resource
|b cr
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|a "ASM International, 2011, number 09110Z"--Page 4 of cover.
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| 500 |
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|a Some online versions lack accompanying media packaged with the printed version.
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| 504 |
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|a Includes bibliographical references and indexes.
|
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0 |
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|a Print version record.
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0 |
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|a Section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.
|
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|a Electronic resource.
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0 |
|a Microelectronics
|x Materials
|x Testing
|v Handbooks, manuals, etc.
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| 650 |
|
0 |
|a Microelectronics
|x Defects
|x Testing
|v Handbooks, manuals, etc.
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| 650 |
|
0 |
|a Electronic apparatus and appliances
|x Testing
|v Handbooks, manuals, etc.
|
| 650 |
|
0 |
|a Electronics
|x Materials
|x Testing
|v Handbooks, manuals, etc.
|
| 650 |
|
0 |
|a Electronics
|x Materials
|x Defects
|v Handbooks, manuals, etc.
|
| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Digital.
|2 bisacsh
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| 650 |
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7 |
|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Microelectronics.
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| 655 |
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|a Electronic books.
|2 local
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1 |
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|a Ross, Richard J.
|0 http://id.loc.gov/authorities/names/n00003843
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| 710 |
2 |
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|a Knovel (Firm)
|0 http://id.loc.gov/authorities/names/nr2001027264
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2 |
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|a ASM International.
|0 http://id.loc.gov/authorities/names/n86066562
|
| 710 |
2 |
|
|a Electronic Device Failure Analysis Society.
|0 http://id.loc.gov/authorities/names/no99092286
|
| 776 |
1 |
8 |
|i Print version:
|t Microelectronics failure analysis.
|b 6th ed.
|d Materials Park, Ohio : ASM International, ©2011
|z 161503725X
|w (OCoLC)701026679
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|u http://proxy.library.tamu.edu/login?url=http://app.knovel.com/hotlink/toc/id:kpMFADRE01/microelectronics-failure-analysis
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|b College Station
|c Electronic Resources
|d Available Online
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| 998 |
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