Advanced transmission electron microscopy : imaging and diffraction in nanoscience /

Bibliographic Details
Main Author: Zuo, Jian Min
Other Authors: Spence, John C. H.
Format: Book
Language:English
Published: New York : Springer Verlag, [2017]
Subjects:

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: TA404.6 .Z86 2017
 
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TA404.6 .Z86 2017 Available