Handbook of speckle interferometry /

This handbook introduces speckle techniques to nonspecialists to help them understand the basic principles of speckle interferometry. The book mainly focuses on the use of speckle patterns with direct phase-measuring methods that produce an instantaneous phase. The major electronic speckle pattern i...

Full description

Bibliographic Details
Main Author: Dávila, Abundio (Author)
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2021].
Series:Tutorial texts in optical engineering ; TT122.
Subjects:
LEADER 02221cam a22003738i 4500
001 in00004584528
008 210904t20212021waua b 001 0 eng
005 20221202165409.7
010 |a  2021021942 
020 |a 9781510645387  |q (paperback) 
020 |a 1510645381 
020 |z 9781510645394  |q (pdf) 
035 |a (OCoLC)on1268545980 
040 |a DLC  |e rda  |c DLC  |d TXA 
050 0 0 |a TA1555  |b .D38 2021 
082 0 0 |a 621.36/75  |2 23 
100 1 |a Dávila, Abundio,  |e author. 
245 1 0 |a Handbook of speckle interferometry /  |c Abundio Dávila. 
264 1 |a Bellingham, Washington :  |b SPIE,  |c [2021]. 
264 4 |c ©2021. 
300 |a xi, 105 pages :  |b illustrations (some color) ;  |c 26 cm. 
336 |a text  |b txt  |2 rdacontent 
337 |a unmediated  |b n  |2 rdamedia 
338 |a volume  |b nc  |2 rdacarrier 
490 1 |a Tutorial texts in optical engineering ;  |v TT122 
504 |a Includes bibliographical references and index. 
505 0 |a Fundamentals of interference -- Speckle interference and displacement -- Electronic speckle pattern interferometers -- Illumination and displacement detection -- Transient displacement analysis -- Phase detection -- Overview of applications. 
520 |a This handbook introduces speckle techniques to nonspecialists to help them understand the basic principles of speckle interferometry. The book mainly focuses on the use of speckle patterns with direct phase-measuring methods that produce an instantaneous phase. The major electronic speckle pattern interferometry (ESPI) techniques are presented using simplified mathematical notation that includes rigid-body and standard-body displacements to estimate object pose changes with six degrees of freedom. Additionally, the adoption of temporal phase unwrapping instead of spatial phase unwrapping is promoted. This handbook also includes a summary of recent industrial applications, with an update on current research in the ESPI field. 
650 0 |a Holographic interferometry. 
650 0 |a Speckle metrology. 
830 0 |a Tutorial texts in optical engineering ;  |v TT122. 
948 |a dmitchel 12/2/22 10.50.40 
994 |a Z0  |b TXA 
999 f f |s f07671d4-06c1-4e36-9f59-3c39df573139  |i f07671d4-06c1-4e36-9f59-3c39df573139  |t 0 
952 f f |p normal  |a Texas A&M University  |b College Station  |c Sterling C. Evans Library  |d Evans: Library Stacks  |t 0  |e TA1555.D38 2021   |h Library of Congress classification  |i unmediated -- volume  |m A14851780818 
998 f f |a TA1555.D38 2021   |t 0  |l Evans: Library Stacks