Showing 1 - 20 results of 20 for search '"computer engineering"', query time: 0.38s Refine Results
  1. 1
    Voltage sensing based built-in current sensor for I [subscript DDQ] test /
    by Xue, Bin, 1974-
    Published 2006
    Subjects: “...Major computer engineering....”
    Link to OAK Trust copy
    Thesis eBook
  2. 2
    Power supply partitioning for placement of built-in current sensors for IDDQ testing /
    by Prasad, Abhijit , 1976-
    Published 2004
    Subjects: “...Major computer engineering....”
    Link to OAK Trust copy
    Thesis eBook
  3. 3
    At-Speed Path Delay Test /
    by Chakraborty, Swati
    Published 2015
    Subjects: “...Major Computer Engineering....”
    Link to OAK Trust copy
    Thesis eBook
  4. 4
    Testing tri-state and pass transistor circuit structures /
    by Parikh, Shaishav, 1980-
    Published 2005
    Subjects: “...Major Computer Engineering (CEEN)...”
    Link to OAK Trust copy
    Thesis eBook
  5. 5
    Variance reduction and outlier identification for I [subscript DDQ] testing of integrated chips using principal component analysis /
    by Balasubramanian, Vijay, 1983-
    Published 2007
    Subjects: “...Major computer engineering....”
    Link to OAK Trust copy
    Thesis eBook
  6. 6
    High quality compact delay test generation /
    by Wang, Zheng
    Published 2011
    Subjects: “...Major computer engineering....”
    Link to OAK Trust copy
    Thesis eBook
  7. 7
    Development of a bridge fault extractor tool /
    by Bhat, Nandan D. 1980-
    Published 2005
    Subjects: “...Major computer engineering....”
    Link to OAK Trust copy
    Thesis eBook
  8. 8
    Path Delay Test Through Memory Arrays /
    by Pokharel, Punj
    Published 2013
    Subjects: “...Major Computer Engineering....”
    Link to OAK Trust copy
    Thesis eBook
  9. 9
    Statistical static timing analysis considering the impact of power supply noise in VLSI circuits /
    by Kim, Hyun Sung
    Published 2010
    Subjects: “...Major computer engineering....”
    Link to OAK Trust copy
    Thesis eBook
  10. 10
    A behavioral model of a built-in current sensor for IDDQ testing /
    by Gharaibeh, Ammar
    Published 2010
    Subjects: “...Major computer engineering....”
    Link to OAK Trust copy
    Thesis eBook
  11. 11
    Integrated circuit outlier identification by multiple parameter correlation /
    by Sabade, Sagar Suresh, 1973-
    Published 2004
    Subjects: “...Major computer engineering....”
    Link to OAK Trust copy
    Thesis eBook
  12. 12
    Pseudo Functional Path Delay Test through Embedded Memories /
    by Gao, Yukun
    Published 2015
    Subjects: “...Major Computer Engineering....”
    Link to OAK Trust copy
    Thesis eBook
  13. 13
    Power supply noise in delay testing /
    by Wang, Jing
    Published 2010
    Subjects: “...Major computer engineering....”
    Link to OAK Trust copy
    Thesis eBook
  14. 14
    An efficient logic fault diagnosis framework based on effect-cause approach /
    by Wu, Lei
    Published 2010
    Subjects: “...Major computer engineering....”
    Link to OAK Trust copy
    Thesis eBook
  15. 15
    Built-in self test (BIST) for realistic delay defects /
    by Tamilarasan, Karthik Prabhu
    Published 2012
    Subjects: “...Major computer engineering....”
    Link to OAK Trust copy
    Thesis eBook
  16. 16
    Yield Simulation for Integrated Circuits /
    by Walker, Duncan Moore Henry
    Published 1987
    Subjects: “...Computer engineering....”
    Connect to the full text of this electronic book
    eBook
  17. 17
    Low cost power and supply noise estimation and control in scan testing of VLSI circuits /
    by Jiang, Zhongwei
    Published 2012
    Subjects: “...Major computer engineering....”
    Link to OAK Trust copy
    Thesis eBook
  18. 18
    Maximizing crosstalk-induced slowdown during path delay test /
    by Gope, Dibakar
    Published 2012
    Subjects: “...Major Computer Engineering....”
    Link to OAK Trust copy
    Thesis eBook
  19. 19
    Optimizing Test Pattern Generation Using Top-Off ATPG Methodology for Stuck-AT, Transition and Small Delay Defect Faults /
    by Gill, Arjun Singh
    Published 2013
    Subjects: “...Major Computer Engineering....”
    Link to OAK Trust copy
    Thesis eBook
  20. 20
    Pseudofunctional delay tests for high quality small delay defect testing /
    by Lahiri, Shayak
    Published 2012
    Subjects: “...Major Computer Engineering....”
    Link to OAK Trust copy
    Thesis eBook
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