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1
Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs).
by
Schuster, C. E.
Published 1995
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Government Document
Microform
Book
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2
Network-centric CAD: a Research Planning Workshop : 3-4 December, 1996, National Institute of Standards and Technology, Gaithersburg, Maryland : workshop proceedings /
Published 1997
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Conference Proceeding
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3
Core product model for representing design information /
by
Fenves, Steven J. (Steven Joseph)
Published 2001
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Government Document
Microform
Book
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Analysis of dimensional metrology standards /
Published 2001
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Book
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A comparison of the CMM-driver specification release #1.9 with the I++ DME-interface release 0.9 /
by
Kramer, Thomas R.
Published 2002
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A survey of design-analysis integration issues /
by
Mocko, Gregory M.
Published 2003
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7
Master product model for the support of tighter integration of spatial and functional design /
Published 2003
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Book
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8
Information models for product representation : core and assembly models /
Published 2004
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National Institute of Standards and Technology (U.S.)
Fenves, Steven J. (Steven Joseph)
4 results
4
Baysal, Mehmet
1 results
1
Bock, C. (Conrad)
1 results
1
Evans, John M. (John Martin), 1942-
1 results
1
Foufou, Sebti
1 results
1
Horst, John Albert
1 results
1
Kramer, Thomas R.
1 results
1
Lyons, Kevin
1 results
1
Manufacturing Engineering Laboratory (U.S.)
1 results
1
Mocko, Gregory M.
1 results
1
Network-centric CAD: a Research Planning Workshop Gaithersburg, Md
1 results
1
Rachuri, Sudarsan
1 results
1
Regli, William C.
1 results
1
Roy, U.| (Utpal)
1 results
1
Schuster, C. E.
1 results
1
Subrahmanian, Eswaran
1 results
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United States. Defense Advanced Research Projects Agency
1 results
1
Wright Laboratory (Wright-Patterson Air Force Base, Ohio)
1 results
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Language
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