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IEEE Computer Society. Test Technology Committee
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Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 /
Published 1981
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Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 /
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The three faces of test : design, characterization, production : proceedings /
Published 1984
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IEEE Computer Society. Test Technology Committee
Institute of Electrical and Electronics Engineers. Philadelphia Section
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