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Interferometry
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European Optical Society
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Optical inspection and micromeasurements : 10-14 June 1996, Besançon, France /
Published 1996
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Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG /
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Microsystem metrology and inspection : 15-16 June 1999, Munich, Germany /
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SAR image analysis, modeling, and techniques III : 25-27 September 2000, Barcelona, Spain /
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Microsystems engineering : metrology and inspection : 20-21 June 2001, Munich, Germany /
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SAR image analysis, modeling, and techniques IV : 17-18 September 2001, Toulouse, France /
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Microsystems engineering : metrology and inspection III : 23-25 June 2003, Munich, Germany /
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SAR image analysis, modeling, and techniques VI : 8 September 2003, Barcelona, Spain /
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SAR image analysis, modeling, and techniques VII : 19-20 September 2005, Bruges, Belgium /
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10
SAR image analysis, modeling, and techniques VIII : 13-14 September 2006, Stockholm, Sweden /
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European Optical Society
Society of Photo-optical Instrumentation Engineers
8 results
8
Gorecki, Christophe
5 results
5
Posa, Francesco
5 results
5
United States. National Aeronautics and Space Administration
4 results
4
Wissenschaftliche Gesellschaft Lasertechnik
2 results
2
Axelsson, Sune R. J.
1 results
1
Commission of the European Communities. Directorate-General for Science, Research, and Development
1 results
1
De Carolis, Giacomo
1 results
1
Guerriero, Luciano
1 results
1
Jüptner, Werner P. O.
1 results
1
Kujawińska, Małgorzata
1 results
1
Notarnicola, Claudia
1 results
1
SPIE Europe
1 results
1
Sociedad Española de Óptica (Spain)
1 results
1
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English
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