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  1. 1
    Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida /
    Published 1987
    Book
  2. 2
    Laser diagnostics : May 4-5, 1982, Arlington, Virginia /
    Published 1982
    Book
  3. 3
    Optics in engineering measurement : 3-6 December 1985, Cannes, France /
    Published 1986
    Book
  4. 4
    Micron and submicron integrated circuit metrology : August 22-23, 1985, San Diego, California /
    Published 1985
    Book
  5. 5
    Precision surface metrology : August 23-24, 1983, San Diego, California /
    Published 1983
    Get full text
    Book
  6. 6
    Field measurement and calibration using electrooptical equipment : issues and requirements, August 24-25, 1982, San Diego, California /
    Published 1983
    Book
  7. 7
    In-process optical metrology for precision machining : 31 March-2 April 1987, The Hague, The Netherlands /
    Published 1987
    Conference Proceeding Book
  8. 8
    Integrated circuit metrology, inspection, and process control : 4-6 March 1987, Santa Clara, California /
    Published 1987
    Book
  9. 9
    Metrology, figure and finish : 15-16 January 1987, Los Angeles, California /
    Published 1987
    Book
  10. 10
    Fluorescence detection II : 13-15 January 1988, Los Angeles, California /
    Published 1988
    Get full text
    Book
  11. 11
    Laser beam radiometry : 14-15 January 1988, Los Angeles, California /
    Published 1988
    Book
  12. 12
    Optical testing and metrology II : 27-30 June 1988, Dearborn, Michigan /
    Published 1989
    Book
  13. 13
    Surface measurement and characterization : ECO1 19-21 September, 1988, Hamburg, Federal Republic of Germany /
    Published 1989
    Conference Proceeding Book
  14. 14
    Integrated circuit metrology, inspection, and process control III, 27-28 February 1989, Los Angeles, California /
    Published 1989
    Book
  15. 15
    Polarimetry: radar, infrared, visible, ultraviolet, and x-ray : 15-17 May 1990, Huntsville, Alabama /
    Published 1990
    Book
  16. 16
    Integrated circuit metrology, inspection, and process control IV : 5-6 March 1990, San Jose, California /
    Published 1990
    Book
  17. 17
    Optical radiation measurements II : 27-28 March 1989, Orlando, Florida /
    Published 1989
    Get full text
    Book
  18. 18
    Long-term monitoring of the Earth's radiation budget : 17-18 April 1990, Orlando, Florida /
    Published 1990
    Get full text
    Conference Proceeding Book
  19. 19
    Chemical, biochemical, and environmental fiber sensors : 6-7 September 1989, Boston, Massachusetts /
    Published 1990
    Conference Proceeding Book
  20. 20
    Fluorescence detection III : 16-18 January 1989, Los Angeles, California /
    Published 1989
    Get full text
    Book
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