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  1. 1
    Secondary ion mass spectroscopy of solid surfaces /
    by Cherepin, Valentin Tikhonovich
    Published 1987
    Book
  2. 2
    Ion formation from organic solids : proceedings of the second international conference, Munster, Fed. Rep. of Germany, September 7-9, 1982 /
    Published 1983
    Conference Proceeding Book
  3. 3
    Desorption mass spectrometry : are SIMS and FAB the same? /
    Published 1985
    Book
  4. 4
    Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 /
    Published 1986
    Conference Proceeding Book
  5. 5
    Ion formation from organic solids (IFOS III) : mass spectrometry of involatile material : proceedings of the third international conference, Munster, Fed. Rep. of Germany, September 16-18, 1985 /
    Published 1986
    Conference Proceeding Book
  6. 6
    Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends /
    by Benninghoven, A.
    Published 1987
    Book
  7. 7
    Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 /
    Published 1984
    Conference Proceeding Book
  8. 8
    Initial kinetic energy of secondary ions desorbed by ²⁵²Cf fission fragments /
    by Jacobs, David Lee
    Published 1988
    Link to OAKTrust copy
    Thesis Book
  9. 9
    Ion formation from organic solids (IFOS IV) : mass spectrometry of involatile material : proceedings of the fourth international conference, Münster, Federal Republic of Germany, September 21-23, 1987 /
    Published 1989
    Conference Proceeding Book
  10. 10
    Ion formation from organic solids (IFOS V) : proceedings of the fifth international conference, Lövånger, Sweden, June 18-21, 1989 /
    Published 1990
    Conference Proceeding Book
  11. 11
    Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis /
    by Wilson, Robert G.
    Published 1989
    Book
  12. 12
    Secondary ion mass spectrometry : principles and applications /
    Published 1989
    Book
  13. 13
    Ion spectroscopies for surface analysis /
    Published 1991
    Book
  14. 14
    Ion and photon emission from keV cluster impacts on surfaces /
    by Yau, Alice Yau-Lic, 1966-
    Published 1992
    Link to OAKTrust copy
    Thesis eBook
  15. 15
    Mass spectrometric analysis with cluster projectiles and coincidence counting /
    by Cox, Bedford Dwain, 1966-
    Published 1992
    Link to OAKTrust copy
    Thesis Book
  16. 16
    Surface analysis of polymers by XPS and static SIMS /
    by Briggs, D. (David), 1948-
    Published 1998
    Book
  17. 17
    Development of a quadrupole-based secondary-ion mass spectrometry (SIMS) system at Lewis Research Center /
    by Vargas-Aburto, Carlos
    Published 1990
    Get full text
    Government Document Microform Book
  18. 18
    New trends and potentialities of ToF-SIMS in surface studies /
    by Grams, Jacek
    Published 2007
    Table of contents only
    Book
  19. 19
    Analysis of LDEF experiment AO187-2 chemical and isotopic measurements of micrometeoroids by secondary ion mass spectrometry : final report NAG1-1174 to the National Aeronautics and Space Administration ; principal investigator, Ernst Zinner.
    by Zinner, Ernst
    Published 1995
    Get full text
    Government Document eBook
  20. 20
    Cluster secondary ion mass spectrometry : principles and applications /
    by Mahoney, Christine M., 1975-
    Published 2013
    Book
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