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Showing 1 - 20 results of 316 for search '"Measurement Congresses."', query time: 0.24s Refine Results
  1. 1
    Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays : 8-9 August 1996, Denver, Colorado /
    Published 1996
    Subjects: “...Semiconductor wafers Measurement Congresses....”
    Book
  2. 2
    Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California /
    Published 1998
    Subjects: “...Semiconductor wafers Measurement Congresses....”
    Book
  3. 3
    Metrology, figure and finish : 15-16 January 1987, Los Angeles, California /
    Published 1987
    Subjects: “...Measurement Congresses....”
    Book
  4. 4
    Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida /
    Published 1987
    Subjects: “...Optoelectronic devices Measurement Congresses....”
    Book
  5. 5
    Optical radiation measurements II : 27-28 March 1989, Orlando, Florida /
    Published 1989
    Subjects: “...Radiation Measurement Congresses....”
    Get full text
    Book
  6. 6
    Surface characterization for computer disks, wafers, and flat panel displays : 28 January 1999, San Jose, California /
    Published 1999
    Subjects: “...Semiconductor wafers Measurement Congresses....”
    Book
  7. 7
    Laser diagnostics : May 4-5, 1982, Arlington, Virginia /
    Published 1982
    Subjects: “...Lasers Measurement Congresses....”
    Book
  8. 8
    Fluorescence detection II : 13-15 January 1988, Los Angeles, California /
    Published 1988
    Subjects: “...Fluorescence Measurement Congresses....”
    Get full text
    Book
  9. 9
    Fluorescence detection III : 16-18 January 1989, Los Angeles, California /
    Published 1989
    Subjects: “...Fluorescence Measurement Congresses....”
    Get full text
    Book
  10. 10
    High-performance optical spectrometry : 1-5 June 1992, Warsaw, Poland /
    Published 1993
    Subjects: “...Optical measurement Congresses....”
    Book
  11. 11
    Proceedings of fluorescence detection IV : 1-2 February 1996, San Jose, California /
    Published 1996
    Subjects: “...Fluorescence Measurement Congresses....”
    Get full text
    Book
  12. 12
    Laser energy distribution profiles : measurements and applications : 16-18 November 1992, Boston, Massachusetts /
    Published 1993
    Subjects: “...Laser beams Measurement Congresses....”
    Get full text
    Book
  13. 13
    Underwater light measurements : 29 June 1993, Tromsö, Norway /
    Published 1993
    Subjects: “...Underwater light Measurement Congresses....”
    Get full text
    Book
  14. 14
    Air pollution and visibility measurements : 20-23 June, 1995, Munich, FRG /
    Published 1995
    Subjects: “...Air Pollution Measurement Congresses....”
    Book
  15. 15
    Atmospheric radiation measurements and applications in climate : 10-11 July, Seattle, USA /
    Published 2002
    Subjects: “...Atmospheric radiation Measurement Congresses....”
    Get full text
    Book
  16. 16
    Gravitational-wave detection : 23-25 August 2002, Waikoloa, Hawaii, USA /
    Published 2003
    Subjects: “...Gravitational waves Measurement Congresses....”
    Get full text
    Book
  17. 17
    Integrated circuit metrology, inspection, and process control VII : 2-4 March 1993, San Jose, California /
    Published 1993
    Subjects: “...Integrated circuits Measurement Congresses....”
    Book
  18. 18
    Metrology, inspection, and process control for microlithography XI : 10-12 March 1997, Santa Clara, California /
    Published 1997
    Subjects: “...Integrated circuits Measurement Congresses....”
    Book
  19. 19
    Long-term monitoring of the Earth's radiation budget : 17-18 April 1990, Orlando, Florida /
    Published 1990
    Subjects: “...Terrestrial radiation Measurement Congresses....”
    Get full text
    Conference Proceeding Book
  20. 20
    In-process optical metrology for precision machining : 31 March-2 April 1987, The Hague, The Netherlands /
    Published 1987
    Subjects: “...Machining Measurement Congresses....”
    Conference Proceeding Book
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