Speckle metrology /

Bibliographic Details
Other Authors: Erf, Robert K.
Format: Book
Language:English
Published: New York : Academic Press, [1978]
Series:Quantum electronics--principles and applications.
Subjects:

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: TA418.7 .S67
 
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TA418.7 .S67 Available