Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 /

Bibliographic Details
Corporate Authors:	International Test Conference Philadelphia, Pa., IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	Silver Spring, MD : IEEE Computer Society Press, 1983.
Subjects:	Integrated circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Automatic test equipment > Congresses. Équipement d'essai automatique > Congrès. Automatic test equipment. Electronic digital computers > Circuits > Testing. Integrated circuits > Testing. Conference papers and proceedings.