Measurement of change of thickness for a thin plate by holographic interferometry /

Measurement of change of thickness for a thin plate by holographic interferometry /

Bibliographic Details
Main Author: Hu, Ching-Piao
Corporate Author: National Science Foundation (U.S.)
Format: Book
Language:English
Published: Urbana : Dept. of Theoretical and Applied Mechanics, University of Illinois, [1974]
Series:T. & A.M. report ; no. 395.
Subjects:
Holography.
Laser interferometers.
Moiré method.
Plates (Engineering) > Testing.

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: TA349 .T3 no.395
 
Call Number Status Get It
TA349 .T3 no.395 Available