Machine vision for inspection and measurement /

Machine vision for inspection and measurement /

Bibliographic Details
Corporate Author: Rutgers University. Center for Computer Aids for Industrial Productivity
Other Authors: Freeman, Herbert
Format: Book
Language:English
Published: Boston : Academic Press, [1989]
Series:Perspectives in computing (Boston, Mass.) ; v. 24.
Subjects:
Computer vision > Congresses.
Engineering inspection > Congresses.

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: TA1632 .M3363 1989
 
Call Number Status Get It
TA1632 .M3363 1989 Available