MOS1 : a program for two-dimensional analysis of Si MOSFETs /

Bibliographic Details
Main Author:	Wilson, Charles L., 1942-
Corporate Author:	United States. National Bureau of Standards
Other Authors:	Blue, J. L.
Format:	Government Document Book
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, National Bureau of Standards, 1985.
Series:	Semiconductor measurement technology. NBS special publication ; 400-77.
Subjects:	Metal oxide semiconductor field-effect transistors > Mathematical models. Metal oxide semiconductor field-effect transistors > Data processing.