Automated inspection and high-speed vision architectures III : 6-7 November 1989, Philadelphia, Pennsylvania /

Automated inspection and high-speed vision architectures III : 6-7 November 1989, Philadelphia, Pennsylvania /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Institute of Electrical and Electronics Engineers. Philadelphia Section, IEEE Industrial Electronics Society, Carnegie-Mellon University. Center for Optical Data Processing
Other Authors: Chen, Michael J. W.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1990]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 1197.
Subjects:
Computer architecture > Congresses.
Pattern recognition systems > Congresses.

Remote Storage

Holdings details from Remote Storage
Call Number: QA76.9.A73 A87 1989
 
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QA76.9.A73 A87 1989 Available