Review of the chronic exposure pathway models in MACCS and several other well-known probabilistic risk assessment models /

Review of the chronic exposure pathway models in MACCS and several other well-known probabilistic risk assessment models /

Bibliographic Details
Main Author: Tveten, Ulf
Corporate Authors: U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Systems Research, Institutt for energiteknikk
Format: Government Document Book
Language:English
Published: Washington, DC : Division of Systems Research, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission : 1990.
Subjects:
Radioactive pollution > Environmental aspects > Data processing.

Evans: US Documents Microfiche (3rd floor)

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Call Number: Y 3.N 88:25/5377
 
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