Proceedings of the ... European Symposium on Reliability of Electron Devices, Failure Physics and Analyses.

Proceedings of the ... European Symposium on Reliability of Electron Devices, Failure Physics and Analyses.

Bibliographic Details
Corporate Authors: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Institute of Electrical and Electronics Engineers, IEEE Electron Devices Society
Format: Conference Proceeding
Language:English
Published: Oxford : Elsevier.
Subjects:
Electronic apparatus and appliances > Reliability > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Integrated circuits > Reliability > Congresses.
Integrated circuits > Testing > Congresses.

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: TK7870 .E86
Notes: Subscription converted to electronic format.
Library Owns: TK7870 .E86 (7th,11th (1996,2000))
Call Number Status Get It
TK7870 .E86 7th 1996 Available
TK7870 .E86 11th 2000 Available