Optical metrology for industrialization of optical information processing /

Bibliographic Details

Main Author:	Casasent, D. P. (David Paul)
Corporate Author:	National Institute of Standards and Technology (U.S.)
Other Authors:	Wilson, Charles L., 1942-
Format:	Government Document Microform Book
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1997]
Series:	NISTIR ; 6060.
Subjects:	Optical data processing. Optical pattern recognition. Information storage and retrieval systems.