Bibliographic Details
| Corporate Authors: |
International Conference on Quality Control by Artificial Vision Gatlinburg, Tenn.,
UT-Battelle,
IEEE Signal Processing Society,
Society of Photo-optical Instrumentation Engineers,
Machine Vision Association of SME |
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| Other Authors: |
Tobin, Kenneth W.,
Meriaudeau, Fabrice |
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| Format: | Conference Proceeding
Book
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| Language: | English |
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| Published: |
Bellingham, Washington :
SPIE,
[2003]
|
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 5132.
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| Subjects: | |
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