Characterization and behavior of interfaces : proceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA /

Bibliographic Details
Corporate Authors: Research Symposium on Characterization and Behavior of Interfaces Atlanta, Ga., Georgia Institute of Technology
Other Authors: Frost, J. David
Format: Conference Proceeding Book
Language:English
Published: Amsterdam ; Fairfax, VA : IOS Press, [2010]
Subjects:

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: TA703.5 .R47 2008
 
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TA703.5 .R47 2008 Available