Reliability of nanoscale circuits and systems /

Bibliographic Details
Main Author:	Stanisavljević, Miloš
Corporate Author:	SpringerLink (Online service)
Other Authors:	Leblebici, Yusuf, Schmid, Alexandre
Format:	eBook
Language:	English
Published:	New York ; London : Springer, 2011.
Subjects:	Nanoelectromechanical systems > Reliability. Nanoelectronics. Electronic books.
Online Access:	Connect to the full text of this electronic book