Heat entrapment effects within liquid acquisition devices /

Bibliographic Details

Main Author:	Duval, W. M. B.
Corporate Authors:	NASA Glenn Research Center, AIAA Aerospace Sciences Meeting
Other Authors:	D. J. Chato, Doherty, M. P.
Format:	Government Document Conference Proceeding eBook
Language:	English
Published:	Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, [2010]
Series:	NASA technical memorandum ; 216789.
Subjects:	Entrapment. Heat flux. Mathematical models. Liquids. Cryogenics. Flow distribution.
Online Access:	https://purl.fdlp.gov/GPO/gpo6923