Robust design of microelectronics assemblies against mechanical shock, temperature and moisture /

This book discusses how the reliability of packaging components is a prime concern to electronics manufacturers. The text presents a thorough review of this field of research, providing users with a practical guide that discusses theoretical aspects, experimental results, and modeling techniques. De...

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Bibliographic Details
Main Authors: Wong, E-H (Author), Mai, Y. W., 1946- (Author)
Corporate Author: Knovel (Firm)
Format: eBook
Language:English
Published: Cambridge, UK : Woodhead Publishing, [2015]
Series:Woodhead Publishing series in electronic and optical materials ; no. 81.
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Call Number: TK7874
 
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