Test Generation of Crosstalk Delay Faults in VLSI Circuits /

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on cu...

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Bibliographic Details

Main Authors:	Jayanthy, S. (Author), Bhuvaneswari, M. C. (Author)
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	Singapore : Springer Singapore : Imprint: Springer, 2019.
Edition:	1st ed. 2019.
Subjects:	Electronic circuits. Microprogramming. Computer software-Reusability. Logic design. Circuits and Systems. Control Structures and Microprogramming. Performance and Reliability. Logic Design.
Online Access:	Connect to the full text of this electronic book